Syosset, NY
(1995-1996)
Consultant
Performed Built In
Test (BIT) analysis,
troubleshooting and critical review of existing digital/analog designs.
Identified design deficiencies through statistical data-analysis
modeling techniques. Wrote specification for a 256 mega-pixel
reconnaissance camera system. Reverse-engineered and created block
diagrams for a complex video system. Participated in a proposal team for
an electro-optical sensor system, obtaining a development contract for
the target product.
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